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"Cost Efficient Defect Detection in Bangle Industry Using Transfer Learning."

Anuranjan Dubey, Abhinandan Dubey (2022)

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DOI: 10.1007/978-3-031-31407-0_14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-17

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  dblp key:
  - conf/cvip/DubeyD22
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  - https://dblp.org/rec/conf/cvip/DubeyD22
Anuranjan Dubey, Abhinandan Dubey:
Cost Efficient Defect Detection in Bangle Industry Using Transfer Learning. CVIP (1) 2022: 181-194

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