"Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature ..."

Reid Pryzant, Stefano Ermon, David B. Lobell (2017)

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DOI: 10.1109/CVPRW.2017.196

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Reid Pryzant, Stefano Ermon, David B. Lobell:
Monitoring Ethiopian Wheat Fungus with Satellite Imagery and Deep Feature Learning. CVPR Workshops 2017: 1524-1532

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