"Layout aware line-edge roughness modeling and poly optimization for ..."

Yongchan Ban, Jae-Seok Yang (2011)

Details and statistics

DOI: 10.1145/2024724.2024828

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

a service of  Schloss Dagstuhl - Leibniz Center for Informatics