"Automatic Incorporation of On-Chip Testability Circuits."

Noriyuki Ito (1990)

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DOI: 10.1145/123186.123393

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Noriyuki Ito:
Automatic Incorporation of On-Chip Testability Circuits. DAC 1990: 529-534

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