"Robust and In-Situ Self-Testing Technique for Monitoring Device Aging ..."

Jiangyi Li, Mingoo Seok (2014)

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DOI: 10.1145/2593069.2593205

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Jiangyi Li, Mingoo Seok:
Robust and In-Situ Self-Testing Technique for Monitoring Device Aging Effects in Pipeline Circuits. DAC 2014: 202:1-202:6

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