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"Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects."

Chin-Chi Teng et al. (1996)

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DOI: 10.1145/240518.240661

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/TengCRK96
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  persistent URL:
  - https://dblp.org/rec/conf/dac/TengCRK96
Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang:
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC 1996: 752-757

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