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"A design-for-test structure for optimising analogue and mixed signal IC test."
A. H. Bratt et al. (1995)
- A. H. Bratt, Andrew Mark David Richardson
, R. J. A. Harvey, A. P. Dorey:
A design-for-test structure for optimising analogue and mixed signal IC test. ED&TC 1995: 24-33
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