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"Extension of the boundary-scan architecture and new idea of BIST for more ..."

Adam Kristof (1997)

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DOI: 10.1109/EDTC.1997.582443

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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Adam Kristof:
Extension of the boundary-scan architecture and new idea of BIST for more effective testing and self-testing of interconnections. ED&TC 1997: 630

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