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"Correlating inline data with final test outcomes in analog/RF devices."

Nathan Kupp, Mustapha Slamani, Yiorgos Makris (2011)

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DOI: 10.1109/DATE.2011.5763138

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/KuppSM11
Nathan Kupp, Mustapha Slamani, Yiorgos Makris:
Correlating inline data with final test outcomes in analog/RF devices. DATE 2011: 812-817

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