"CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns."

Yanjing Li, Samy Makar, Subhasish Mitra (2008)

Details and statistics

DOI: 10.1109/DATE.2008.4484786

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics