"Pattern Selection for Testing of Deep Sub-Micron Timing Defects."

Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng (2004)

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DOI: 10.1109/DATE.2004.1269033

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng:
Pattern Selection for Testing of Deep Sub-Micron Timing Defects. DATE 2004: 160

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