"Compact Test Pattern Generation For Multiple Faults In Deep Neural Networks."

Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori (2023)

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DOI: 10.23919/DATE56975.2023.10137004

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-07

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Dina A. Moussa, Michael Hefenbrock, Mehdi B. Tahoori:
Compact Test Pattern Generation For Multiple Faults In Deep Neural Networks. DATE 2023: 1-2

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