"Process variation and temperature-aware reliability management."

Cheng Zhuo, Dennis Sylvester, David T. Blaauw (2010)

Details and statistics

DOI: 10.1109/DATE.2010.5457139

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-31

a service of  Schloss Dagstuhl - Leibniz Center for Informatics