"A Graph-Learning-Driven Prediction Method for Combined Electromigration ..."

Yunfan Zuo et al. (2024)

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DOI: 10.23919/DATE58400.2024.10546799

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-30

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Yunfan Zuo, Yuyang Ye, Hongchao Zhang, Tinghuan Chen, Hao Yan, Longxing Shi:
A Graph-Learning-Driven Prediction Method for Combined Electromigration and Thermomigration Stress on Multi-Segment Interconnects. DATE 2024: 1-6

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