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"Transient Current Testing of Dynamic CMOS Circuits."

Najwa Aaraj et al. (2004)

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DOI: 10.1109/DFT.2004.62

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Najwa Aaraj, Anis Nazer, Ali Chehab, Ayman I. Kayssi:
Transient Current Testing of Dynamic CMOS Circuits. DFT 2004: 264-271

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