"Making defect avoidance nearly invisible to the user in wafer scale field ..."

Glenn H. Chapman, Benoit Dufort (1996)

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DOI: 10.1109/DFTVS.1996.571980

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Glenn H. Chapman, Benoit Dufort:
Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays. DFT 1996: 11-20

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