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"Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies."

Michelle L. La Haye et al. (2006)

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DOI: 10.1109/DFT.2006.31

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/HayeJCCD06
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  persistent URL:
  - https://dblp.org/rec/conf/dft/HayeJCCD06
Michelle L. La Haye, Cory Jung, David Chen, Glenn H. Chapman, Jozsef Dudas:
Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. DFT 2006: 448-456

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