"Failure Factor Based Yield Enhancement for SRAM Designs."

Yu-Tsao Hsing et al. (2004)

> Home

Details and statistics

DOI: 10.1109/DFT.2004.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  - electronic edition @ ieeecomputersociety.org
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dft/HsingWWHW04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/HsingWWHW04
Yu-Tsao Hsing, Chih-Wea Wang, Ching-Wei Wu, Chih-Tsun Huang, Cheng-Wen Wu:
Failure Factor Based Yield Enhancement for SRAM Designs. DFT 2004: 20-28

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.