"Improving a Test Set to Cover Test Holes by Detecting Gate-Exhaustive Faults."

Irith Pomeranz (2020)

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DOI: 10.1109/DFT50435.2020.9250778

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-17

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Irith Pomeranz:
Improving a Test Set to Cover Test Holes by Detecting Gate-Exhaustive Faults. DFT 2020: 1-4

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