"Concurrent On-Line Testing of Identical Circuits Through Output Comparison ..."

Irith Pomeranz, Sudhakar M. Reddy (2004)

Details and statistics

DOI: 10.1109/DFT.2004.20

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics