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"On the correlation between Static Noise Margin and Soft Error Rate ..."

Elena I. Vatajelu et al. (2013)

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DOI: 10.1109/DFT.2013.6653597

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné:
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFTS 2013: 143-148

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