"Designs for Reducing Test Time of Distributed Small Embedded SRAMs."

Baosheng Wang, Yuejian Wu, André Ivanov (2004)

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DOI: 10.1109/DFT.2004.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Baosheng Wang, Yuejian Wu, André Ivanov:
Designs for Reducing Test Time of Distributed Small Embedded SRAMs. DFT 2004: 120-128

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