"On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a ..."

Shianling Wu et al. (2008)

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DOI: 10.1109/DFT.2008.29

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Shianling Wu, Laung-Terng Wang, Zhigang Jiang, Jiayong Song, Boryau Sheu, Xiaoqing Wen, Michael S. Hsiao, James Chien-Mo Li, Jiun-Lang Huang, Ravi Apte:
On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. DFT 2008: 143-151

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