"Core Test Wrapper Design to Reduce Test Application Time for Modular SoC ..."

Hyunbean Yi, Sandip Kundu (2008)

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DOI: 10.1109/DFT.2008.13

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hyunbean Yi, Sandip Kundu:
Core Test Wrapper Design to Reduce Test Application Time for Modular SoC Testing. DFT 2008: 412-420

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