"Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure ..."

Zhikuan Chen, Yufeng Sun, Yuqing Xue (2023)

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DOI: 10.1109/DSA59317.2023.00079

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-24

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Zhikuan Chen, Yufeng Sun, Yuqing Xue:
Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion. DSA 2023: 565-574

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