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"Bringing Machine Intelligence to Welding Visual Inspection: Development of ..."

Yifu Gong et al. (2018)

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DOI: 10.2352/ISSN.2470-1173.2018.09.IRIACV-279

access: open

type: Conference or Workshop Paper

metadata version: 2023-11-12

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  dblp key:
  - conf/ei-iriacv/GongLWG18
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  - https://dblp.org/rec/conf/ei-iriacv/GongLWG18
Yifu Gong, Zhibin Lin, Jinhui Wang, Na Gong:
Bringing Machine Intelligence to Welding Visual Inspection: Development of Low-Cost Portable Embedded Device for Welding Quality Control. IRIACV 2018: 1-4

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