"Projecting the rate of in-field pixel defects based on pixel size, sensor ..."

Glenn H. Chapman et al. (2012)

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DOI: 10.1117/12.910096

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-06

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Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren:
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2012: 82980E

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