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2020 – today
- 2023
[c46]Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren:
Image Degradation in Time Due to Interacting Hot Pixels. DFT 2023: 1-6- 2022
- [c45]Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Image Degradation due to Interacting Adjacent Hot Pixels. DFT 2022: 1-6 - 2021
- [c44]Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT 2021: 1-4 - 2020
- [c43]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren:
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT 2020: 1-4
2010 – 2019
- 2019
- [c42]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren:
Detecting SEUs in Noisy Digital Imagers with small pixels. DFT 2019: 1-6 - [c41]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Image degradation from hot pixel defects with pixel size shrinkage. IMSE 2019: 1-7 - 2018
- [c40]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT 2018: 1-6 - [c39]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren:
Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE 2018: 1-6 - 2017
- [c38]Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren:
Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT 2017: 1-4 - [c37]Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren:
Hot Pixel Behavior as Pixel Size Reduces to 1 micron. IMSE 2017: 39-45 - 2016
- [c36]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren:
Experimental study and analysis of soft and permanent errors in digital cameras. DFT 2016: 11-14 - [c35]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren:
Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE 2016: 1-6 - 2015
- [c34]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren:
Single Event Upsets and Hot Pixels in digital imagers. DFTS 2015: 41-46 - [c33]Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren:
Enhanced correction methods for high density hot pixel defects in digital imagers. IMSE 2015: 94030T - 2014
- [j12]R. C. Ravindran, C. Mani Krishna, Israel Koren, Zahava Koren:
Scheduling imprecise task graphs for real-time applications. Int. J. Embed. Syst. 6(1): 73-85 (2014) - [c32]Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren:
Improved correction for hot pixels in digital imagers. DFT 2014: 116-121 - [c31]Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren:
Correcting high-density hot pixel defects in digital imagers. IMSE 2014: 90220G - 2013
- [c30]Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren:
Improved image accuracy in Hot Pixel degraded digital cameras. DFTS 2013: 172-177 - [c29]Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren:
Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2013: 86590C - 2012
- [c28]Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren:
Relating digital imager defect rates to pixel size, sensor area and ISO. DFT 2012: 164-169 - [c27]Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete
, Zahava Koren, Israel Koren:
Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications 2012: 82980E - [c26]Abhinna Jain, C. M. Krishna, Israel Koren, Zahava Koren:
Cost Functions for Scheduling Tasks in Cyber-physical Systems. ICINCO (1) 2012: 412-421 - [c25]Glenn H. Chapman, Israel Koren, Zahava Koren:
Do more camera pixels result in a better picture? IOLTS 2012: 73-78 - 2011
- [c24]Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren:
Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT 2011: 408-416 - [c23]Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren:
Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications 2011: 78750I - 2010
- [c22]Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren:
Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT 2010: 231-239
2000 – 2009
- 2009
- [j11]Srikanth Sundaresan, Israel Koren, Zahava Koren, C. Mani Krishna:
Event-driven adaptive duty-cycling in sensor networks. Int. J. Sens. Networks 6(2): 89-100 (2009) - [c21]Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren:
Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT 2009: 155-163 - [c20]Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren:
Statistical identification and analysis of defect development in digital imagers. Digital Photography 2009: 72500 - 2008
- [c19]Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren:
Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT 2008: 305-313 - 2007
- [c18]Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren:
Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT 2007: 526-534 - [c17]Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren:
Identification of in-field defect development in digital image sensors. Digital Photography 2007: 65020Y - 2006
- [c16]Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren:
On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT 2006: 439-447 - 2005
- [c15]Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung:
On-Line Identification of Faults in Fault-Tolerant Imagers. DFT 2005: 149-157 - 2004
- [j10]Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren:
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Des. Test Comput. 21(6): 544-551 (2004) - [c14]E. Ciocca, Israel Koren, Zahava Koren, C. Mani Krishna, Daniel S. Katz:
Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer. PRDC 2004: 43-48 - 2003
- [c13]Jayakrishnan Nair, Zahava Koren, Israel Koren, C. Mani Krishna:
Pre-Processing Input Data to Augment Fault Tolerance in Space Applications. DSN 2003: 491-500 - 2002
- [c12]Zahava Koren, J. Rajagopal, C. Mani Krishna, Israel Koren, W. Wang, J. Loman:
Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems. IPDPS 2002 - 2001
- [c11]Israel Koren, Zahava Koren, Glenn H. Chapman:
Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT 2001: 3-10 - 2000
- [j9]Israel Koren, Zahava Koren:
Incorporating Yield Enhancement into the Floorplanning Process. IEEE Trans. Computers 49(6): 532-541 (2000) - [c10]Israel Koren, Zahava Koren, Glenn H. Chapman:
A Self-Correcting Active Pixel Camera. DFT 2000: 56- - [c9]Vijay Lakamraju, Zahava Koren, C. Mani Krishna:
Synthesis of Interconnection Networks: A Novel Approach. DSN 2000: 501-509
1990 – 1999
- 1998
- [j8]Israel Koren, Zahava Koren:
Defect tolerance in VLSI circuits: techniques and yield analysis. Proc. IEEE 86(9): 1819-1838 (1998) - [c8]Israel Koren, Zahava Koren:
Yield and Routing Objectives in Floorplanning. DFT 1998: 28-36 - [c7]Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna:
Measuring the Vulnerability of Interconnection Networks in Embedded Systems. IPPS/SPDP Workshops 1998: 919-924 - [c6]Zahava Koren, Israel Koren, C. Mani Krishna:
Surge Handling as a Measure of Real-Time System Dependability. IPPS/SPDP Workshops 1998: 1106-1116 - 1997
- [j7]Zahava Koren, Israel Koren:
On the effect of floorplanning on the yield of large area integrated circuits. IEEE Trans. Very Large Scale Integr. Syst. 5(1): 3-14 (1997) - [c5]Israel Koren, Zahava Koren:
Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs. DFT 1997: 166-174 - 1994
- [j6]Régis Leveugle, Zahava Koren, Israel Koren, Gabriele Saucier, Norbert Wehn:
The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis. IEEE Trans. Computers 43(12): 1398-1406 (1994) - [j5]Israel Koren, Zahava Koren, Charles H. Stapper:
A statistical study of defect maps of large area VLSI IC's. IEEE Trans. Very Large Scale Integr. Syst. 2(2): 249-256 (1994) - 1993
- [j4]Israel Koren, Zahava Koren, Charles H. Stapper:
A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits. IEEE Trans. Computers 42(6): 724-734 (1993) - [c4]Zahava Koren, Israel Koren:
Does the Floorplan of a Chip Affect Its Yield? DFT 1993: 159-166 - 1991
- [j3]Israel Koren, Zahava Koren:
Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems. IEEE Trans. Computers 40(9): 1024-1033 (1991) - [c3]Aura Ganz, Zahava Koren:
WDM Passive Star-Protocols and Performance Analysis. INFOCOM 1991: 991-1000
1980 – 1989
- 1988
- [j2]Imrich Chlamtac, Aura Ganz, Zahava Koren:
Prioritized demand assignment protocols and their evaluation. IEEE Trans. Commun. 36(2): 133-143 (1988) - [c2]Israel Koren, Zahava Koren:
On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components. ICDCS 1988: 26-32 - 1986
- [j1]Israel Koren, Zahava Koren, Stephen Y. H. Su:
Analysis of a Class of Recovery Procedures. IEEE Trans. Computers 35(8): 703-712 (1986) - [c1]Zahava Koren, Imrich Chlamtac, Aura Ganz:
A model for evaluating demand assignment protocols with arbitrary workloads. SIGCOMM 1986: 40-44
Coauthor Index
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