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"Code Defect Detection Model with Multi-layer Bi-directional Long Short ..."
Cong Hou et al. (2023)
- Cong Hou
, Yue Sun
, Lin Li
, Wei Chen
, Xiaotian Xu
:
Code Defect Detection Model with Multi-layer Bi-directional Long Short Term Memory based on Self-Attention Mechanism. EITCE 2023: 1656-1660
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