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"Defect Detection in the Manufacturing Domain Using Product Design Data and ..."

Subin Choi, Hyungmin Kim, Hansang Cho (2024)

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DOI: 10.1109/ICEIC61013.2024.10457208

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-02

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Subin Choi, Hyungmin Kim, Hansang Cho:
Defect Detection in the Manufacturing Domain Using Product Design Data and Self-Knowledge Distillation. ICEIC 2024: 1-4

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