"Runtime Embedded Software Malfunction Detection Based on Profile ..."

Sanghoon Lee, Daejin Park (2025)

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DOI: 10.1109/ICEIC64972.2025.10879721

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-07

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Sanghoon Lee, Daejin Park:
Runtime Embedded Software Malfunction Detection Based on Profile Generation of Current-Level Pattern Matcher. ICEIC 2025: 1-5

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