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"Analog design trends and challenges in 28 and 20nm CMOS technology."

Pierre Dautriche (2011)

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DOI: 10.1109/ESSCIRC.2011.6044906

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Pierre Dautriche:
Analog design trends and challenges in 28 and 20nm CMOS technology. ESSCIRC 2011: 1-4

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