"A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with ..."

Brice Lhomme et al. (2010)

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DOI: 10.1109/ESSCIRC.2010.5619718

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-27

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Brice Lhomme, Yann Carminati, Bertrand Borot, Olivier Callen, Thierry Burdeau, Sylvain Clerc:
A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter. ESSCIRC 2010: 362-365

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