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"Impact of field cycling on HfO2 based non-volatile memory devices."
Uwe Schroeder et al. (2016)
- Uwe Schroeder
, Milan Pesic, Tony Schenk, Halid Mulaosmanovic
, Stefan Slesazeck, Johannes Ocker, Claudia Richter, Ekaterina Yurchuk, K. Khullar, Johannes Müller, Patrick Polakowski, E. D. Grimley, J. M. LeBeau, Stefan Flachowsky, S. Jansen, Sabine Kolodinski, Ralf Van Bentum, Alfred Kersch
, Christopher Künneth
, Thomas Mikolajick
:
Impact of field cycling on HfO2 based non-volatile memory devices. ESSDERC 2016: 364-368
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