"A drift-diffusion-based analytic description of the energy distribution ..."

Prateek Sharma et al. (2016)

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DOI: 10.1109/ESSDERC.2016.7599677

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Prateek Sharma, Stanislav Tyaginov, Stewart E. Rauch, Jacopo Franco, Ben Kaczer, Alexander Makarov, Mikhail I. Vexler, Tibor Grasser:
A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs. ESSDERC 2016: 428-431

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