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"Resistive-open defect influence in SRAM pre-charge circuits: analysis and ..."

Luigi Dilillo et al. (2005)

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DOI: 10.1109/ETS.2005.33

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/ets/DililloGPVH05
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan:
Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization. ETS 2005: 116-121

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