"MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in ..."

Sina Bakhtavari Mamaghani et al. (2025)

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DOI: 10.1109/ETS63895.2025.11049314

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-07

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Sina Bakhtavari Mamaghani, Jongsin Yun, Martin Keim, Mehdi Baradaran Tahoori:
MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. ETS 2025: 1-6

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