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"Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring."

Kazuki Monta et al. (2021)

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DOI: 10.1109/ETS50041.2021.9465391

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  dblp key:
  - conf/ets/MontaKFHNM21
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  - https://dblp.org/rec/conf/ets/MontaKFHNM21
Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen:
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring. ETS 2021: 1-4

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