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"Reducing the susceptibility of design-for-delay-testability structures to ..."

Herman J. Vermaak, Hans G. Kerkhoff (2001)

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DOI: 10.1109/ETW.2001.946658

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Herman J. Vermaak, Hans G. Kerkhoff:
Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. ETW 2001: 35-41

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