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"A built-in method for measuring the delay of TSVs in 3D ICs."

Han-Yu Wu, Yong-Xiao Chen, Jin-Fu Li (2016)

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DOI: 10.1109/ETS.2016.7519293

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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  - conf/ets/WuCL16
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Han-Yu Wu, Yong-Xiao Chen, Jin-Fu Li:
A built-in method for measuring the delay of TSVs in 3D ICs. ETS 2016: 1-6

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