"Application of local design-for-reliability techniques for reducing ..."

Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh (2004)

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DOI: 10.1109/ETSYM.2004.1347593

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh:
Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. ETS 2004: 24-29

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