"LASSO-based Health Indicator Extraction Method for Semiconductor ..."

Dima El Jamal et al. (2022)

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DOI: 10.23919/ECC55457.2022.9838058

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Dima El Jamal, Bouchra Ananou, Guillaume Graton, Mustapha Ouladsine, Jacques Pinaton:
LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes. ECC 2022: 491-496

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