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"SCAN/BIST Techniques for Decreasing Test Storage and their implications to ..."

Roberto Bevacqua, Luca Guerrazzi, Franco Fummi (1996)

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DOI: 10.1109/EURMIC.1996.546458

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/euromicro/BevacquaGF96
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  persistent URL:
  - https://dblp.org/rec/conf/euromicro/BevacquaGF96
Roberto Bevacqua, Luca Guerrazzi, Franco Fummi:
SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation. EUROMICRO 1996: 351-

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