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"TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS."

Hochang Chae et al. (2009)

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DOI: 10.1007/978-3-642-10619-4_25

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-05

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  dblp key:
  - conf/fgit/ChaeJLC09
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  - https://dblp.org/rec/conf/fgit/ChaeJLC09
Hochang Chae, Xiulin Jin, Seonghun Lee, Jeonghun Cho:
TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS. FGIT-ASEA 2009: 204-212

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