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"Optimally mitigating BTI-induced FPGA device aging with discriminative ..."

Yu Bai, Mohammed Alawad, Mingjie Lin (2014)

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DOI: 10.1145/2554688.2554752

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-02

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  - conf/fpga/YuAL14
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Yu Bai, Mohammed Alawad, Mingjie Lin:
Optimally mitigating BTI-induced FPGA device aging with discriminative voltage scaling (abstract only). FPGA 2014: 246

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