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"Aging-Induced Failure Prognosis via Digital Sensors."

Md Toufiq Hasan Anik et al. (2023)

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DOI: 10.1145/3583781.3590204

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-15

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  dblp key:
  - conf/glvlsi/AnikRDGK23
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  - https://dblp.org/rec/conf/glvlsi/AnikRDGK23
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Aging-Induced Failure Prognosis via Digital Sensors. ACM Great Lakes Symposium on VLSI 2023: 703-708

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