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"Guided test generation for isolation and detection of embedded trojans in ics."

Mainak Banga et al. (2008)

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DOI: 10.1145/1366110.1366196

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-03

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  - conf/glvlsi/BangaCFH08
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Mainak Banga, Maheshwar Chandrasekar, Lei Fang, Michael S. Hsiao:
Guided test generation for isolation and detection of embedded trojans in ics. ACM Great Lakes Symposium on VLSI 2008: 363-366

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