"Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation."

Song Bian et al. (2016)

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DOI: 10.1145/2902961.2903013

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato:
Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. ACM Great Lakes Symposium on VLSI 2016: 203-208

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