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"Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation."
Song Bian et al. (2016)
- Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato:
Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation. ACM Great Lakes Symposium on VLSI 2016: 203-208
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