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"A linear statistical analysis for full-chip leakage power with spatial ..."

Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong (2010)

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DOI: 10.1145/1785481.1785536

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Ruijing Shen, Sheldon X.-D. Tan, Jinjun Xiong:
A linear statistical analysis for full-chip leakage power with spatial correlation. ACM Great Lakes Symposium on VLSI 2010: 227-232

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