"Simultaneous reduction in test data volume and test time for TRC-reseeding."

Bin Zhou, Yizheng Ye, Yongsheng Wang (2007)

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DOI: 10.1145/1228784.1228802

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Bin Zhou, Yizheng Ye, Yongsheng Wang:
Simultaneous reduction in test data volume and test time for TRC-reseeding. ACM Great Lakes Symposium on VLSI 2007: 49-54

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